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Werth Contour Probe WCP
Applications that previously used a stylus or contour tracer can be done for the first time during the CMM operation using the patented Werth Contour Probe. This tactile probe enables surface finish or form / contour to be measured in defined workpiece coordinates, in any direction during one measurement and can analyse micro and macro forms.
Please contact us for more information on our Werth Contour Probe WCP
Applications that previously used a stylus or contour tracer can be done for the first time during the CMM operation using the patented Werth Contour Probe. This tactile probe enables surface finish or form / contour to be measured in defined workpiece coordinates, in any direction during one measurement and can analyse micro and macro forms.
Please contact us for more information on our Werth Contour Probe WCP
For more information on Werth Contour Probe WCP talk to Purdue Metrology
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