The Factory Diagnosis Diagram – An Efficient Tool

The Factory Diagnosis Diagram becomes an Inclusive Tool when Analysing Coatings and Measuring Coating Thickness New software developed by three industry experts shows ‘at a glance’ if there’s a weakness in your manufacturing process or production line. During electroplating or heat treatment operations parts are usually mounted on plating or charging racks. An optimized production process should exhibit no significant changes in the quality characteristics of the products after going through the production cycle regardless of the product's position on the rack. Measurement results taken from a random sample of finished parts over a number of predetermined rack locations can be displayed easily in a Factory-Diagnosis-Diagram (FDD®), which is introduced in this paper. The descriptive nature of this type of diagram truly provides an "at a glance" display of essential quality related information. Weaknesses in a manufacturing process or a production line become evident, without the need for complex data analysis. The advantages of the Factory Diagnosis Diagram, highlighted in this paper, can be applied to nearly all areas of production, offering a practical solution for quality manufacturing management. Follow the link on the home page to read the full article www.fischer-material-analysis.co.uk The Authors of this Paper Prof. Dr.-Ing. Dieter Dengel, born 1937, studied Mechanical Engineering/Materials Technology and qualified as a University professor for the subject Materials Engineering. From 1970 to 2003, he was a university professor at the TU Berlin. Helmut Fischer, born 1931, is the founder and managing director of Helmut Fischer GmbH with its headquarters in Sindelfingen, Germany. He has been active in the field of non-destructive coating thickness measurement since 1953. Dr. rer. nat. Hans-Peter Vollmar, born 1959, studied physics and earned his doctor's degree in the field of semiconductor physics. Active from 1993 to 1998 as project director at ILK Dresden GmbH (instrument development laser spectroscopy for atmospheric gas pollutant analysis), from 1998 to 1999 as Application Scientist at Rudolph Technologies lnc., New Jersey (coating thickness measuring systems in the semiconductor industry) and since the end of 1999 as department director in Development at Helmut Fischer GmbH.

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