RENISHAW SCANNING PROBES

THE RIGHT PROBE FOR THE JOB WENZEL provides a comprehensive range of Renishaw Scanning probes that can acquire several hundred surface points each second, enabling measurement of form as well as size and position. Scanning probes can also be used to acquire discrete points in a similar way to touch-trigger probes. A range of solutions is available, suitable for all sizes and configurations of CMM. Scanning provides a fast way to capture form and profile data from prismatic or complex components. While touch-trigger probes gather discrete points on the surface, scanning systems acquire vast quantities of surface data, providing a clearer picture of the form and shape of the workpiece. Scanning is therefore ideal for measurement applications where the form of a feature is a significant element of the overall error budget, or where complex surfaces must be inspected. Scanning requires a fundamentally different approach to sensor design, machine control and data analysis. Renishaw scanning probes feature innovative, lightweight passive mechanisms (no motors or locking mechanisms) that exhibit a high natural frequency, making them suitable for high speed scanning. Isolated optical metrology systems measure the deflection of the stylus directly (not via stacked axes within the probe mechanism) for better accuracy and faster dynamic response. SP25M 25 mm diameter scanning probe with scanning and touch-trigger modules SP600 High-performance inspection, digitising and profile scanning SP80 Quill-mounted scanning probe providing class-leading performance with long styli

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