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What makes Synergie-CAD's Verti-P technology superior for high-parallelism testing?
Verti-P uses conical-tip micro-spring pins, offering mechanical compliance, minimized pad damage, and test parallelism exceeding 256 dies. This reduces test costs and time for chipmakers needing high throughput.
Verti-P uses conical-tip micro-spring pins, offering mechanical compliance, minimized pad damage, and test parallelism exceeding 256 dies. This reduces test costs and time for chipmakers needing high throughput.
For more information on What makes Synergie-CAD's Verti-P technology superior for high-parallelism testing? talk to Synergie-Cad (UK) Ltd
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