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View Micro-metrology Systems

View Micro-metrology Systems

Our View Micro-metrology Systems offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements. The View Micro-metrology Systems are designed for measurement of parts and assemblies with complex dimensions and a high density of features. If you have any query regarding our View Micro-metrology Systems, please feel free to call us on 01283 585933!

For more information on  View Micro-metrology Systems  talk to  OGP UK Ltd

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