X-Ray Fluorescence Systems for Materials Analysis

HELMUT FISCHER has been making X-Ray Fluorescence systems to measure coating thickness and perform material analysis for more than 21 years. Through the exact treatment of all relevant processes involving the physical principles of the XRF measurement method and the use of the latest hardware and software technology FISCHER's X-Ray instruments deliver features not found elsewhere. The unique Software WinFTM® Version 6 (V.6) is the heart of these instruments. It enables the measurement of very complex coating systems, without calibration standards and with a predicted measurement accuracy, as well as the analysis of materials with up to 24 elements with WinFTM® Version 6. For more details on the spectrometer systems for materials analysis and coating thickness measurement, please follow the web link

For more information on X-Ray Fluorescence Systems for Materials Analysis talk to Fischer Instrumentation