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JESD22-B110 Compliant Shock Tester
This high-speed shock test system delivers precise, high-acceleration testing for mobile phones, computer parts, optical components, and connectors. Compliant with JESD22-B110 standards, it uses a half-sine short wave to ensure repeatable, accurate results. Ideal for validating performance and durability under rapid shock conditions in sensitive electronic devices.
This high-speed shock test system delivers precise, high-acceleration testing for mobile phones, computer parts, optical components, and connectors. Compliant with JESD22-B110 standards, it uses a half-sine short wave to ensure repeatable, accurate results. Ideal for validating performance and durability under rapid shock conditions in sensitive electronic devices.
For more information on JESD22-B110 Compliant Shock Tester talk to CentraTEQ Ltd
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