Ion Beam Analysis

We have considerable expertise in a wide range of characterisation methods and metrology of thin films with specialty in ion beam analysis (e.g. SIMS , ule-SIMS, Rutherford Backscattering, etc). We also provide a range of microscopy services including SEM and TEM. The combination of a range of analytical techniques, an "investigative approach" and our expertise in analytical methods together with a knowledge of the materials involved enables us to provide unambiguous answers to complex issue. The application areas include a wide range of semiconductor materials, nanolayers, photovoltaic materials, metallurgical coatings, coatings on glass & polymers and a host of other functional thin films.

For more information on Ion Beam Analysis talk to Aystorm Scientific Ltd