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Hiden Analytical release their new brochure detailing the latest
features of the SIMS/SNMS Workstation for high-sensitivity static
and dynamic surface analysis. Applicable technologies range
from photovoltaics, metallurgy, semiconductors and thin-film
studies through to geology and gem-stone characterisation.
The ultrahigh vacuum sample loading and sample transfer stages
with fast-entry load lock enable preloading and reloading of
multiple samples for optimum cost-effective operational
efficiency. With fine-focus oxygen, argon and caesium ion
sources the system provides elemental analysis of both
electropositive and electronegative species, the
high-transmission mass spectrometer detector additionally
featuring the SNMS Mode with measurement of secondary
neutrals giving precise data quantification. Mass range is
selectable to 1000amu, with the exceptional sensitivity
maintained to the lowest molecular weight species boron,
beryllium and lithium through to monatomic hydrogen.
All mass spectrometer and ion gun control parameters are fully
software integrated, the pre-programmable pull-down menus
providing fast and automated operation for diverse analysis
requirements. Elemental imaging is provided by the optional ESM
Elemental Surface Mapping suite to identify multilayer surface
location and distribution of all relevant species in real time.
For a copy of the brochure and further information on all Hiden
Analytical products contact Hiden Analytical at info@hiden.co.uk
or visit the main website at www.HidenAnalytical.com
For more information on New SIMS Workstation Brochure from Hiden Analytical talk to Hiden Analytical Ltd
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