Sign In
Hiden SIMS bolt-on mass spectrometers and ion guns
enable a complete SIMS facility to be added to diverse
analytical UHV surface analysis facilities, and the latest
Hiden EQS probe now offers the inclusion of an integrated
SNMS mode to provide the dual roles of sputtered neutral
and secondary ion mass spectrometry. The dual
techniques are beneficial for the measurement of optical
and metallurgical coatings, alloys, corrosion layers and
architectural coatings for example, enabling direct
quantification of concentration over the full range from trace
level to 100%.
The high-transparency electron impact ioniser at the
immediate entry region to the probe ensures efficient
ionisation of sputtered neutrals and optimum transmission
efficiency for secondary ions. Both SIMS and SNMS can be
combined throughout a continuous measurement sequence
to provide quantified depth profiling data through the widest
concentration range.
The full product range includes both gas and metal-sourced
ion guns. Both the probe and the ion guns require a
chamber mounting port diameter of just 38mm(1.5 inches)
diameter.
For further information on all Hiden Analytical products
contact Hiden Analytical at info@hiden.co.uk or visit the
main website at www.HidenAnalytical.com.
For more information on Bolt-on SIMS Analyser for FIB Microscopes providing Chemical Composition Analysis talk to Hiden Analytical Ltd
Enquire Now
More News
List your company on FindTheNeedle.