4D Inspec XL micro-defect measurement system wins 2019 Prism award

We are pleased to announce that the�4D InSpec XL�surface defect gauge has won the�2019 Prism award in Test and Measurement.� The award was presented to 4D Technology during the Photonics West 2019 expo by SPIE, the International Society for Optics and Photonics.

For more information on 4D Inspec XL micro-defect measurement system wins 2019 Prism award talk to Spectrum Metrology Ltd