FIB-SIMS Nano-scale Material Analysis

Hiden Analytical offers high-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems, providing outstanding surface specificity and a naturally high dynamic range for advanced nanoscale material analysis. Our FIB-SIMS systems are poised to enhance your operations, from routine detection tasks to complex sample preparation.

For more information on FIB-SIMS Nano-scale Material Analysis talk to Hiden Analytical Ltd