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Hiden Analytical announces a new
range of surface and surface
interface diagnostic tools. Based on
the UHV Secondary Ion Mass
Spectrometry (SIMS) technique the
new tools provide for high
performance surface elemental and
contamination analysis together with
depth profiling with nanometer scale
depth resolution.
SIMS Workstation
Hiden surface diagnostics systems are designed to work well with many sample types
including metallurgical thin films, coatings, solar cells, and semiconductors. Crucially the
new systems include excellent depth and spatial resolution providing 3D images of the
uppermost layers of surfaces and thin films on a nano/micron scale. A wide range of
sample sizes and shapes can be accommodated in the UHV sample load lock making the
Hiden surface diagnostics tools extremely versatile.
Historically high performance SIMS tools have only been available at a very high capital
cost combined with an ongoing high cost of ownership. The Hiden SIMS analysis tool is
a modular system starting at a foundation level and offers world class performance at an
affordable price level combined with extremely low cost of ownership. The systems
include a dedicated SIMS user interface making operation straightforward, with user
training for a new starter typically completed within just 2 -3 days.
For further information on this or any other Hiden Analytical products contact Hiden
Analytical at
info@hiden.co.uk or visit the main website at www.HidenAnalytical.com.
For more information on New Surface and Surface Interface diagnostic systems talk to Hiden Analytical Ltd
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