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Werth Nano Focus Probe NFP
The NFP measures topography and roughness of surfaces with the principle of confocal microscopy. Even cutting edge radii on tools or layer thicknesses can be measured.
Please contact us for more information on our Werth Nano Focus Probe NFP
The NFP measures topography and roughness of surfaces with the principle of confocal microscopy. Even cutting edge radii on tools or layer thicknesses can be measured.
Please contact us for more information on our Werth Nano Focus Probe NFP
For more information on Werth Nano Focus Probe NFP talk to Purdue Metrology
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